Observations on the grain-boundary of Al2O3 bicrystals

O. Maruyama, W. Komatsu ∗
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引用次数: 15

Abstract

The grain-boundary thickness of alumina bicrystals, fabricated without the aid of sintering additives and pressure, was measured with an optical microscope. The thickness was 500 to 550 Å and independent of the tilt angle. Impurities segregated at the grain-boundary and the surface of the same sample was studied with an ion microanalyser. The segregation of Ca and Si at both interfaces was noticeable but that of Mg was not. The thickness of the segregation region for both interfaces was 600 to 800 Å. The spheroidization of tubular voids into pores at the grain-boundary was controlled by surface diffusion. Discussion of the fabrication process of the bicrystal in terms of initial sintering kinetics concluded that the process was controlled by the surface diffusion.

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Al2O3双晶晶界的观察
用光学显微镜测量了在没有烧结添加剂和压力的情况下制备的氧化铝双晶的晶界厚度。厚度为500到550 Å,与倾斜角度无关。用离子微量分析仪研究了同一样品在晶界和表面分离的杂质。Ca和Si在两个界面处的偏析明显,而Mg的偏析不明显。两个界面的偏析区厚度均为600 ~ 800 Å。管状孔洞在晶界处球化成孔隙受表面扩散控制。从初始烧结动力学的角度讨论了双晶的制备过程,得出该过程受表面扩散控制的结论。
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