Fast AFM probes switching method via Integrated dual-probes

Abstract

As the core component of the atomic force microscope(AFM), the probe directly affects the measurement results. Many AFM-based experiments require control validation of the same target in a sample in different modes. The existing dual-probe system is complex, cannot switch the same target, and cannot be applied to the existing commercial AFM system. In this paper, an integrated dual-probe design based on a common probe is proposed, and a single optical path lever is used for sensing, which can quickly switch imaging at the same target. A U-shape dual-probe structure was designed, and the single-optical path signal decoupling was realized by distinguishing the resonant frequencies of the dual-probes. The designed integrated dual-probe can perform different modifications on the tip to achieve rapid switching imaging of the same target with different functions, and is fully compatible with commercial AFMs without the limitations of systems and environments.