A. Petrov, A. Vasil'ev, A. Ulanova, A. Chumakov, A. Nikiforov
{"title":"Flash memory cells data loss caused by total ionizing dose and heavy ions","authors":"A. Petrov, A. Vasil'ev, A. Ulanova, A. Chumakov, A. Nikiforov","doi":"10.2478/s11534-014-0503-6","DOIUrl":null,"url":null,"abstract":"The paper provides experimental results of flash memory loss data investigation. Possible mechanisms of charge loss from storage element are reviewed. We provide some guidelines for flash memory evaluation to space application.","PeriodicalId":50985,"journal":{"name":"Central European Journal of Physics","volume":"113 1","pages":"725-729"},"PeriodicalIF":0.0000,"publicationDate":"2014-08-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"28","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Central European Journal of Physics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2478/s11534-014-0503-6","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 28
Abstract
The paper provides experimental results of flash memory loss data investigation. Possible mechanisms of charge loss from storage element are reviewed. We provide some guidelines for flash memory evaluation to space application.