The electrical and optical properties of LiAlxB1−x thin films

Abstract

The electrical and optical properties of LiAl_xB_1−x thin films deposited at 350°C by the Sandwich-Type Evaporation Method are measured. These films are metallic with a resistivity of (1–4) × 10⁵ ohm cm at room temperature. In addition, we have developed a unique method. named the Brewster Angle Method (BAM), for obtaining the optical constants of thin films for LiAl_xB_1−x. In this method reflection coefficients are measured on the surface of thin films at any angle of incidence using a HeNe laser beam. The optical constants are calculated from the Brewster angle, φ_B, at the minimum value of reflection coefficient $\text{|}\text{R}{}_{\mathrm{<mtext>B</mtext>}}\text{|}{}_{\mathrm{<mtext>min</mtext>}}$. For a typical LiAl_xB_1−x film the optical constants are $\text{n}\text{= 1.42 −}\text{j}\text{0.31}$ and the complex dielectric constants are $\text{ϵ}\text{= 1.94 −}\text{j}\text{0.87}$.