Shu-Tsung Hsu, Yean‐San Long, Teng‐Chun Wu, M. Tsai
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引用次数: 1
Abstract
In the first of this two-part communication, this paper presented the apparatus and test procedures of a new performance test method for OPV/DSSC according to its spectrum response (SR) measurement and device qualification. Calculation and standardization are addressed in Part II [1]. OPV/DSSC needs specific basis of reference to differ with standard test condition (STC) used by p-n junction solar cell, and reserves extra time for SR test due to capacity effect. Results were applied to SEMI Doc. 5647 and released as SEMI PV69 [2] by voting in 2015.
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