Adam Wojcik, Matthew Waitt, Alberto S. Santos, A. Shibli
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引用次数: 1
Abstract
ABSTRACT To help determine remaining lifetime of pressure vessels suffering creep, the authors have previously developed a method and presented promising results using a combination of AC and DC electrical potential drop (EPD) on-line monitoring, detecting both final cracking as well as incipient creep damage. The latter was tentatively ascribed to the development of cavitation damage, but recent modelling and separate off-line measurements have shown that cavitation is unlikely to provide enough of a change in electrical properties to explain all of the variations previously observed. Here we gather the results obtained to date, and review their likely relationships in an attempt to obtain a greater insight into the mechanisms at play. Whilst changes in both on-line and off-line EPD are largely in accord, the belief now is that the changes seen cannot be fully explained by cavitation development and that EPD is responding to other creep induced phenomena as well.
期刊介绍:
Materials at High Temperatures welcomes contributions relating to high temperature applications in the energy generation, aerospace, chemical and process industries. The effects of high temperatures and extreme environments on the corrosion and oxidation, fatigue, creep, strength and wear of metallic alloys, ceramics, intermetallics, and refractory and composite materials relative to these industries are covered.
Papers on the modelling of behaviour and life prediction are also welcome, provided these are validated by experimental data and explicitly linked to actual or potential applications. Contributions addressing the needs of designers and engineers (e.g. standards and codes of practice) relative to the areas of interest of this journal also fall within the scope. The term ''high temperatures'' refers to the subsequent temperatures of application and not, for example, to those of processing itself.
Materials at High Temperatures publishes regular thematic issues on topics of current interest. Proposals for issues are welcomed; please contact one of the Editors with details.