{"title":"Spectroscopic ellipsometry of amorphous Ni0.95Tb0.05 and crystalline nickel","authors":"B.-Y. Yang, K. Vedam, P. Klosowski, J.S. Lannin","doi":"10.1016/0025-5416(88)90340-0","DOIUrl":null,"url":null,"abstract":"<div><p>Spectroscopic ellipsometry was used to determine the pseudodielectric constants of thin film sputtered crystalline nickel and the concentrated amorphous Ni<sub>0.95</sub>Tb<sub>0.05</sub> alloy. The variation in <em>ϵ</em><sub>2</sub>(<em>ω</em>)/<em>λ</em>, which indicates the matrix element weighted joint density of states, is found to be relatively similar for both crystalline and amorphous systems. This is interpreted in terms of related short-range order and similar d band states in both these materials.</p></div>","PeriodicalId":100890,"journal":{"name":"Materials Science and Engineering","volume":"99 1","pages":"Pages 281-283"},"PeriodicalIF":0.0000,"publicationDate":"1988-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0025-5416(88)90340-0","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Materials Science and Engineering","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/0025541688903400","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Spectroscopic ellipsometry was used to determine the pseudodielectric constants of thin film sputtered crystalline nickel and the concentrated amorphous Ni0.95Tb0.05 alloy. The variation in ϵ2(ω)/λ, which indicates the matrix element weighted joint density of states, is found to be relatively similar for both crystalline and amorphous systems. This is interpreted in terms of related short-range order and similar d band states in both these materials.
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