Analysis of coupling of composite dielectric resonator structure using mode matching technique

T. Bhattacharjee, X. Tu
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Abstract

A completely shielded dielectric resonator (DR) structure consisting of a DR placed on a dielectric substrate is considered. This configuration is compared with one that has a very-low-dielectric-constant spacer. Particularly, the coupling coefficient between the DR and the microstrip line is analyzed and evaluated by using the mode-matching technique, which is based on dividing the resonator structure into partial regions and regarding them as sections of dielectrically loaded waveguides. The propagation constants are found by solving the resulting transcendental equation by enforcing the continuity of the tangential field components inside each partial region and the condition of vanishing tangential electric field on the metallic enclosure. The numerical evaluation of the coupling is obtained for different DR materials and different substrate thicknesses. The electric field distributions inside the structure with and without the space are also evaluated and compared.<>
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基于模式匹配技术的复合介质谐振器结构耦合分析
考虑了一种完全屏蔽的介质谐振器结构,该结构由放置在介质衬底上的介质谐振器组成。将这种结构与具有极低介电常数间隔的结构进行比较。特别地,利用模式匹配技术分析和评估了DR与微带线之间的耦合系数,该技术是基于将谐振腔结构划分为局部区域并将其视为介电负载波导的截面。通过在每个局部区域内施加切向电场分量的连续性和金属外壳上切向电场消失的条件,通过求解得到的超越方程得到传播常数。对不同的DR材料和衬底厚度下的耦合进行了数值计算。并对有和无空间时结构内部的电场分布进行了评价和比较。
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