Edgebond adhesive enhances the reliability of low-temperature solder in board-level assembly (IMPACT 2022)

S. Chang, Tae-Kyu Lee, Wei Li, K. Loh, E. Ibe, Simon Wang
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Abstract

Low melting temperature solder, which enables a lower temperature assembly process comes with significant benefits for less warpage and lower component defect risk, but at a cost of a potentially inferior thermal cycling performance due to higher creep rate at an elevated temperature environment.The creep rate can be reduced by dispensing underfill between BGA and PCB to lower thermal stress concentrated on the corner. Thus, the thermal cycling performance would be improved. However, this would increase difficulty when replacing the BGA. For this reason, applying edgebond on the peripheral of the BGA in the assembly process makes it easier to operate on during the rework process. Additionally, it will reduce material consumption dramatically for big BGAs.In this study, we evaluate the reliability of low-temperature solders, Sn-58Bi, used in the BGA, 12mm*12mm, assembly without edgebond and with edgebond. Comparing the characteristic life cycle number of 3328 cycles with Sn-58Bi solder, the full edgebond BGAs’ does not show any failures up to the test completion at 4050 cycles.To extend edgebond applications for the strong need for extra-large BGA in today’s electronics industry, we use simulation methods to compare the thermal stress of the solder joints when BGA size increases from 12mm by 12mm to 70mm by 70mm, and up to 100*100mm. These include the BGA assembly without edgebond and with edgebond. As thermal stress increases, the thermal cycle reliability shortens. From simulated thermal stress results, we can predict the edgebond’s significant benefit for the thermal cycling reliability of extra-large BGA on the board level assembly.
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Edgebond粘合剂提高了板级组装中低温焊料的可靠性(IMPACT 2022)
低熔点焊料可以实现更低温度的组装工艺,具有更少翘曲和更低组件缺陷风险的显着优势,但其代价是在高温环境下由于较高的蠕变率而导致潜在的较差的热循环性能。通过在BGA和PCB之间添加下填料,可以降低集中在边角的热应力,从而降低蠕变速率。从而提高热循环性能。然而,这将增加更换BGA的难度。因此,在装配过程中对BGA外设应用边键可以使其在返工过程中更容易操作。此外,它将大大减少大型BGAs的材料消耗。在这项研究中,我们评估了低温焊料Sn-58Bi用于BGA, 12mm*12mm,无边键和带边键组装的可靠性。与Sn-58Bi焊料的3328个周期的特征生命周期数进行比较,在4050个周期的测试完成时,全边缘键合BGAs没有显示任何故障。为了扩展边缘键合应用,以满足当今电子行业对超大BGA的强烈需求,我们使用模拟方法来比较当BGA尺寸从12mm × 12mm增加到70mm × 70mm以及增加到100 × 100mm时焊点的热应力。这些包括不带边键和带边键的BGA组件。随着热应力的增大,热循环可靠性变短。从模拟的热应力结果中,我们可以预测边键对板级组件上超大BGA的热循环可靠性有显著的好处。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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