Observations of "effective" transverse beam-size instabilities for a high current per bunch fill pattern in the APS storage ring

A. Lumpkin, L. Emery, B. Yang
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引用次数: 2

Abstract

The X-ray pinhole camera diagnostics on the Advanced Photon Source (APS) storage ring have recorded an "effective" transverse beam size instability during operations with a sextuplet plus 22 singlets fill pattern. These instabilities were not observed with the sextuplet plus 25 triplets fill pattern that has been the standard fill pattern in FY'98. The instability threshold is at 82-85 mA with positrons. The features include an increased average (few seconds) transverse size both horizontally anti vertically for stored currents above the threshold with a correlated effect on the beam lifetime. The horizontal transverse emittance is 25-30% larger at 100 mA than below the threshold. There is a related horizontal beam centroid motion as well, but this does not explain the vertical size change nor the lifetime effect. Complementary data were also taken with the diagnostic undulator, and a similar threshold effect on divergence was observed. The cross-comparison of the data and possible mechanisms are presented.
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APS存储环中每束高电流填充模式的“有效”横向波束尺寸不稳定性观察
在先进光子源(APS)存储环上的x射线针孔相机诊断记录了在六重态加22个单重态填充模式下的“有效”横向光束尺寸不稳定性。这些不稳定性在1998年标准的六联体加25三联体填充模式中没有观察到。带正电子的不稳定阈值为82 ~ 85 mA。其特点包括增加平均(几秒)横向尺寸水平和垂直存储电流高于阈值与光束寿命相关的影响。水平横向发射度在100 mA时比低于阈值时大25-30%。也有一个相关的水平梁质心运动,但这并不能解释垂直尺寸的变化,也不能解释寿命效应。补充数据也与诊断波动器,并观察到类似的阈值效应发散。提出了数据的交叉比较和可能的机制。
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