Electrochemical Activity of Pure and Sn-Doped CeO2 Nanoparticles using Simple Chemical Precipitation Method

K. Anandalakshmi, P. Venkatachalam, J. Venugobal
{"title":"Electrochemical Activity of Pure and Sn-Doped CeO2 Nanoparticles using Simple Chemical Precipitation Method","authors":"K. Anandalakshmi, P. Venkatachalam, J. Venugobal","doi":"10.3329/jsr.v15i1.56206","DOIUrl":null,"url":null,"abstract":"In the present work, pure and Sn-doped CeO2 nanoparticles (NPs) were synthesized by the chemical precipitation method calcined at 400 ºC for 4 h. Characterization of NPs was done through X-ray diffraction (XRD), UV-visible, photoluminescence (PL), Fourier transform infrared (FTIR) spectroscopy and high-resolution electron microscope (HRTEM) techniques. The XRD study revealed the crystalline nature, size, and structure of the prepared NPs. The HRTEM results illustrated cubic structure. The UV–visible and PL studies were used to measure the optical behaviors of CeO2 NPs. The UV-visible showed that the bandgap value of CeO2 NPs increased from 3.61 to 3.65 eV for different doping concentrations. The XRD study exhibited that the size of the CeO2 NPs reduced from 11.03 to 7.91 nm. From the TEM analysis, the average size of undoped and 10% Sn-doped CeO2 NPs was calculated as 9.3 and 7 nm, respectively. A cyclic voltammetric study confirmed that Sn-doped CeO2 exhibited a higher specific capacitance value than the pure CeO2. The chemical precipitation method observed excellent redox and oxidation behavior were observed for Sn-CeO2 NPs by the cyclic voltammetric study. The significant enhancement in the specific capacitance suggested that Sn-doped CeO2 is a promising material for supercapacitor applications.","PeriodicalId":16984,"journal":{"name":"JOURNAL OF SCIENTIFIC RESEARCH","volume":"68 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"JOURNAL OF SCIENTIFIC RESEARCH","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3329/jsr.v15i1.56206","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

In the present work, pure and Sn-doped CeO2 nanoparticles (NPs) were synthesized by the chemical precipitation method calcined at 400 ºC for 4 h. Characterization of NPs was done through X-ray diffraction (XRD), UV-visible, photoluminescence (PL), Fourier transform infrared (FTIR) spectroscopy and high-resolution electron microscope (HRTEM) techniques. The XRD study revealed the crystalline nature, size, and structure of the prepared NPs. The HRTEM results illustrated cubic structure. The UV–visible and PL studies were used to measure the optical behaviors of CeO2 NPs. The UV-visible showed that the bandgap value of CeO2 NPs increased from 3.61 to 3.65 eV for different doping concentrations. The XRD study exhibited that the size of the CeO2 NPs reduced from 11.03 to 7.91 nm. From the TEM analysis, the average size of undoped and 10% Sn-doped CeO2 NPs was calculated as 9.3 and 7 nm, respectively. A cyclic voltammetric study confirmed that Sn-doped CeO2 exhibited a higher specific capacitance value than the pure CeO2. The chemical precipitation method observed excellent redox and oxidation behavior were observed for Sn-CeO2 NPs by the cyclic voltammetric study. The significant enhancement in the specific capacitance suggested that Sn-doped CeO2 is a promising material for supercapacitor applications.
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用简单化学沉淀法研究纯和掺锡CeO2纳米颗粒的电化学活性
本文采用化学沉淀法在400℃下煅烧4 h,合成了纯锡掺杂的CeO2纳米颗粒(NPs)。通过x射线衍射(XRD)、紫外可见、光致发光(PL)、傅里叶变换红外(FTIR)光谱和高分辨率电子显微镜(HRTEM)技术对NPs进行了表征。XRD研究揭示了所制备的纳米粒子的晶体性质、尺寸和结构。HRTEM结果显示为立方结构。利用紫外可见光谱和PL光谱研究了CeO2纳米粒子的光学行为。紫外可见光谱表明,不同掺杂浓度下CeO2 NPs的带隙值从3.61 eV增加到3.65 eV。XRD研究表明,CeO2纳米粒子的尺寸从11.03 nm减小到7.91 nm。TEM分析显示,未掺杂和10% sn掺杂的CeO2 NPs的平均尺寸分别为9.3 nm和7 nm。循环伏安研究证实,掺杂sn的CeO2比纯CeO2具有更高的比电容值。化学沉淀法观察到Sn-CeO2 NPs具有良好的氧化还原和氧化行为。比电容的显著增强表明,锡掺杂CeO2是一种很有前途的超级电容器材料。
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审稿时长
16 weeks
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