Takashi Sumida, Kosuke Hashimoto, S. Fukui, T. Hirato, T. Nagata, H. Yamamoto, N. Iwata
{"title":"Magnetic Properties and Crystal Structure Analysis of Ferromagnetic Metal / r-plane Oriented Cr2O3 Multilayer","authors":"Takashi Sumida, Kosuke Hashimoto, S. Fukui, T. Hirato, T. Nagata, H. Yamamoto, N. Iwata","doi":"10.14723/TMRSJ.42.1","DOIUrl":null,"url":null,"abstract":"We report the crystal structures and magnetic properties of [Pt/Co]3/Pt/r-oriented Cr2O3 multilayers fabricated by DC-RF magnetron sputtering method. From the results of 2θ-θ x-ray diffraction profile, highly r-plane (11 _ 02) oriented Cr2O3 film grows. Preferable orientation of Pt and Co films is (111). The lattice spacing of r-plane Cr2O3 was 0.363 nm. This value is in agreement with that of the bulk, indicating that the film is grown without stress from the substrate. From the reciprocal space mapping, both the substrate and film peaks were visible for (22 _ 010) plane, while no peaks were observed for the (22 _ 08) plane. The magnetic property of the multilayer is investigated by magnetic field (H) dependences of the magnetizations (M). The exchange bias filed, HEB, was -150Oe at 5K, which is the first observation using highly ordered rplane Cr2O3 film.","PeriodicalId":23220,"journal":{"name":"Transactions-Materials Research Society of Japan","volume":"16 1","pages":"1-3"},"PeriodicalIF":0.0000,"publicationDate":"2017-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Transactions-Materials Research Society of Japan","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.14723/TMRSJ.42.1","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
We report the crystal structures and magnetic properties of [Pt/Co]3/Pt/r-oriented Cr2O3 multilayers fabricated by DC-RF magnetron sputtering method. From the results of 2θ-θ x-ray diffraction profile, highly r-plane (11 _ 02) oriented Cr2O3 film grows. Preferable orientation of Pt and Co films is (111). The lattice spacing of r-plane Cr2O3 was 0.363 nm. This value is in agreement with that of the bulk, indicating that the film is grown without stress from the substrate. From the reciprocal space mapping, both the substrate and film peaks were visible for (22 _ 010) plane, while no peaks were observed for the (22 _ 08) plane. The magnetic property of the multilayer is investigated by magnetic field (H) dependences of the magnetizations (M). The exchange bias filed, HEB, was -150Oe at 5K, which is the first observation using highly ordered rplane Cr2O3 film.
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