Thickness of Adsorbed Polystyrene Layers by Ellipsometry.

Abstract

The adsorption of polystyrene from cyclohexane below the theta temperature onto chrome ferrotype plate was studied by means of ellipsometry (polarization spectrometry). In this technique changes in the state of polarization of polarized light are measured upon reflection from a film-covered surface. The measurements were carried out in situ and permitted determination of the thickness and refractive index of the swollen polymer film at the solidsolution interface. A concentration range of 0.18 to 9.7 mg/ml was studied for polymer with a molecular weight of 76,000. The thickness of the adsorbed film increased with increasing solution concentration, reaching a plateau for most of the concentration range studied. The average thickness at this plateau was approximately 210 Å. The adsorbed film was highly swollen, consisting of about 12 g/100 ml of polymer for most of the concentration range. The amount adsorbed was determined to be approximately 2.25×10^-4 mg/cm² at the plateau. Comparison of the radius of gyration of polystyrene in solvent is made to the results obtained.