Y. Shin, Ll Kim, Seong-Hwan Kang, Se-Hun Lee, Jun-Hyun Park, Jae-Mo Kang
{"title":"AMFM: AugMix-empowered FixMatch for High-Performing Semi-Supervised Classification of Metal Surface Defects","authors":"Y. Shin, Ll Kim, Seong-Hwan Kang, Se-Hun Lee, Jun-Hyun Park, Jae-Mo Kang","doi":"10.5391/jkiis.2022.32.5.424","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":17349,"journal":{"name":"Journal of The Korean Institute of Intelligent Systems","volume":"20 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2022-10-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of The Korean Institute of Intelligent Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.5391/jkiis.2022.32.5.424","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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