B. Moore, C. Sellathamby, P. Cauvet, H. Fleury, M. Paulson, M. Reja, Lin Fu, B. Bai, E. Reid, I. Filanovsky, Steven Slupsky
{"title":"High throughput non-contact SiP testing","authors":"B. Moore, C. Sellathamby, P. Cauvet, H. Fleury, M. Paulson, M. Reja, Lin Fu, B. Bai, E. Reid, I. Filanovsky, Steven Slupsky","doi":"10.1109/TEST.2007.4437595","DOIUrl":null,"url":null,"abstract":"A non-contact method for parallel testing of system-in-package (SiP) assemblies is presented. This technology allows for JTAG testing of partially or fully populated SiPs in wafer form, in advance of final packaging. The technology utilizes non-contact GHz short-range, near field communications to transfer bi-directional data to SiP substrates; creating a wireless test access port or WTAP. The system is integrated with a standard probe card to deliver power and wireless signals. The wireless probes convert high frequency RF (GHz) transceiver signals to standard tester ATE logic levels and allow the use of standard probers and JTAG testers. In addition, all transceivers (DUTand probe) use antenna structures and electronics that are fully CMOS compliant. Enhancing the economics of SiP manufacture by enabling parallel non-contact testing of SiPs before packaging is a key benefit of this technology.","PeriodicalId":6403,"journal":{"name":"2007 IEEE International Test Conference","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2007-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2007.4437595","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 21
Abstract
A non-contact method for parallel testing of system-in-package (SiP) assemblies is presented. This technology allows for JTAG testing of partially or fully populated SiPs in wafer form, in advance of final packaging. The technology utilizes non-contact GHz short-range, near field communications to transfer bi-directional data to SiP substrates; creating a wireless test access port or WTAP. The system is integrated with a standard probe card to deliver power and wireless signals. The wireless probes convert high frequency RF (GHz) transceiver signals to standard tester ATE logic levels and allow the use of standard probers and JTAG testers. In addition, all transceivers (DUTand probe) use antenna structures and electronics that are fully CMOS compliant. Enhancing the economics of SiP manufacture by enabling parallel non-contact testing of SiPs before packaging is a key benefit of this technology.
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