{"title":"The μmRIXS spectrometer at BESSY II","authors":"A. Pietzsch","doi":"10.17815/JLSRF-2-80","DOIUrl":null,"url":null,"abstract":"The μmRIXS confocal plane grating spectrometer offers high resolution resonant inelastic x-ray scattering (RIXS) spectroscopy in the soft x-ray range between 50 eV and 1000 eV. The small focus of its dedicated beamline allows for spectroscopical imaging at selected sample sites with a spatial resolution of 1 micrometer.","PeriodicalId":16282,"journal":{"name":"Journal of large-scale research facilities JLSRF","volume":"29 1","pages":"55"},"PeriodicalIF":0.0000,"publicationDate":"2016-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of large-scale research facilities JLSRF","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.17815/JLSRF-2-80","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The μmRIXS confocal plane grating spectrometer offers high resolution resonant inelastic x-ray scattering (RIXS) spectroscopy in the soft x-ray range between 50 eV and 1000 eV. The small focus of its dedicated beamline allows for spectroscopical imaging at selected sample sites with a spatial resolution of 1 micrometer.
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