Highly absorbing and high lifetime tapered silicon microwire arrays as an alternative for thin film crystalline silicon solar cells

S. Yalamanchili, Hal S. Emmer, N. Lewis, H. Atwater
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引用次数: 4

Abstract

We report cryogenic inductively coupled plasma reactive ion etching (ICPRIE) etched tapered silicon microwires are ideal light trapping structures with extremely low (1.08% between 400 nm-1100 nm under normal incidence) reflectivity. We show that these tapered microwire arrays absorb 90.12% of incident light under normal incidence in an effectively 20 μm thick silicon when embedded in a polymer and peeled off the substrate, making them an attractive alternative for achieving high efficiency in thin film crystalline silicon solar cells. We show that microwave photoconductivity decay measurements as a simple quick way to measure carrier lifetimes in etched microwires under various liquid surface passivation techniques to estimate surface recombination velocities. The etched structures demonstrate >1 μs lifetimes.
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高吸收和高寿命的锥形硅微线阵列作为薄膜晶体硅太阳能电池的替代品
我们报道了低温电感耦合等离子体反应离子蚀刻(ICPRIE)蚀刻的圆锥硅微线是理想的光捕获结构,具有极低的反射率(在正常入射下,400 nm-1100 nm之间为1.08%)。我们的研究表明,当嵌入聚合物并剥离衬底时,这些锥形微线阵列在有效的20 μm厚硅中吸收正常入射光的90.12%,使其成为薄膜晶体硅太阳能电池中实现高效率的有吸引力的替代方案。我们表明,微波光导衰减测量是一种简单快速的方法,可以测量蚀刻微导线在各种液体表面钝化技术下的载流子寿命,以估计表面复合速度。蚀刻结构的寿命为bb0.1 μs。
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