A new computer-automated microscope stage system for fission-track analysis

Abstract

A new Macintosh^TM-controlled microscope stage and digitizing tablet system has been developed that automates external detector method grain-to-mica matching, track length measurement, slide scanning, object centering, and file management within a single, well-integrated, user-friendly program environment. The system is based on a high-quality Kinetek^TM aumated sanning stage that has found wide use in the microelectronics industry. A unique feature of the system is use of the digitizing tablet cursor to control most stage actions, resulting in a very intuitive and natural mode of operation, and faster and less tedious analysis of samples than with other automated systems.