Michael C. Cao, Jonathan Schwartz, Huihuo Zheng, Yi Jiang, R. Hovden, Yimo Han
{"title":"Atomic Defect Identification with Sparse Sampling and Deep Learning","authors":"Michael C. Cao, Jonathan Schwartz, Huihuo Zheng, Yi Jiang, R. Hovden, Yimo Han","doi":"10.1007/978-3-030-96498-6_28","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":6718,"journal":{"name":"2020 IEEE International Conference on Systems, Man, and Cybernetics (SMC)","volume":"28 1","pages":"455-463"},"PeriodicalIF":0.0000,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE International Conference on Systems, Man, and Cybernetics (SMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-030-96498-6_28","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}