C. Camus, C. Kaspari, J. Rappich, V. Blank, N. Nickel
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引用次数: 1
Abstract
In this paper a novel method for in-situ monitoring of a complete perovskite fabrication process by means of highspeed spectral reflectance measurements is introduced. Firstly, the spin-coating deposition and secondly, the annealing process is monitored. The results clearly show that this method is capable to fully characterize the perovskite growth kinetics and the phase transitions during thin film annealing. Thereby in-situ reflectance constitutes an ideal method for monitoring perovskite formation, which as of today often suffers from poor reproducibility. This paper focuses on the experimental implementation of the in-situ- reflectance measurements during spin-coating.
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