{"title":"A Survey on Test pattern compression Techniques in Analog and Mixed signal circuits","authors":"J. Poornimasre, R. Harikumar, P. Saravanakumar","doi":"10.32622/IJRAT.76201902","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":14303,"journal":{"name":"International Journal of Research in Advent Technology","volume":"13 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2019-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Journal of Research in Advent Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.32622/IJRAT.76201902","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
