{"title":"A portable and fault-tolerant microprocessor based on the SPARC v8 architecture","authors":"J. Gaisler","doi":"10.1109/DSN.2002.1028926","DOIUrl":null,"url":null,"abstract":"The architecture and implementation of the LEON-FT processor is presented. LEON-FT is a fault-tolerant 32 bit processor based on the SPARC V8 instruction set. The processors tolerates transient SEU errors by using techniques such as TMR registers, on-chip EDAC, parity, pipeline restart, and forced cache miss. The first prototypes were manufactured on the Atmel ATC35 0.35 /spl mu/m CMOS process, and subjected to heavy-ion fault-injection at the Louvain Cyclotron. The heavy-ion tests showed that all of the injected errors (>100,000) were successfully corrected without timing or software impact. The device SEU threshold was measured to be below 6 MeV while ion energy-levels of up to 110 MeV were used for error injection.","PeriodicalId":93807,"journal":{"name":"Proceedings. International Conference on Dependable Systems and Networks","volume":"1 1","pages":"409-415"},"PeriodicalIF":0.0000,"publicationDate":"2002-06-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"202","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. International Conference on Dependable Systems and Networks","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DSN.2002.1028926","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 202
Abstract
The architecture and implementation of the LEON-FT processor is presented. LEON-FT is a fault-tolerant 32 bit processor based on the SPARC V8 instruction set. The processors tolerates transient SEU errors by using techniques such as TMR registers, on-chip EDAC, parity, pipeline restart, and forced cache miss. The first prototypes were manufactured on the Atmel ATC35 0.35 /spl mu/m CMOS process, and subjected to heavy-ion fault-injection at the Louvain Cyclotron. The heavy-ion tests showed that all of the injected errors (>100,000) were successfully corrected without timing or software impact. The device SEU threshold was measured to be below 6 MeV while ion energy-levels of up to 110 MeV were used for error injection.