P. Petrashin, W. Lancioni, Agustin Laprovitta, J. Castagnola
{"title":"Embedded Radiation sensor with OBIST structure for applications in mixed signal systems","authors":"P. Petrashin, W. Lancioni, Agustin Laprovitta, J. Castagnola","doi":"10.12962/jaree.v5i2.194","DOIUrl":null,"url":null,"abstract":"Oscillation based testing (OBT) has proven to be a simple and effective test strategy for numerous kind of circuits. In this work, OBT is applied to a radiation sensor to be used as a VLSI cell in embedded applications, implementing an oscillation built-in self-test (OBIST) structure. The oscillation condition is achieved by means of a minimally intrusive switched feedback loop and the response evaluation circuit can be included in a very simple way, minimizing the hardware overhead. The fault simulation indicates a fault coverage of 100% for the circuit under test.Keywords: fault simulation, mixed signal testing, OBIST, oscillation-based test, VLSI testing.","PeriodicalId":32708,"journal":{"name":"JAREE Journal on Advanced Research in Electrical Engineering","volume":"80 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2021-10-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"JAREE Journal on Advanced Research in Electrical Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.12962/jaree.v5i2.194","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Oscillation based testing (OBT) has proven to be a simple and effective test strategy for numerous kind of circuits. In this work, OBT is applied to a radiation sensor to be used as a VLSI cell in embedded applications, implementing an oscillation built-in self-test (OBIST) structure. The oscillation condition is achieved by means of a minimally intrusive switched feedback loop and the response evaluation circuit can be included in a very simple way, minimizing the hardware overhead. The fault simulation indicates a fault coverage of 100% for the circuit under test.Keywords: fault simulation, mixed signal testing, OBIST, oscillation-based test, VLSI testing.
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