Yidan Wei, Xingji Li, Chaoming Liu, Yong Liu, Jinyu Zhao, S. Dong, Hongxia Li, Qingyan Wang
{"title":"Atomic and electron analyzing of irradiation damage in Si/SiO2 interfaces caused by irradiation: First-principle calculation","authors":"Yidan Wei, Xingji Li, Chaoming Liu, Yong Liu, Jinyu Zhao, S. Dong, Hongxia Li, Qingyan Wang","doi":"10.1016/J.NIMB.2019.04.010","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":19302,"journal":{"name":"Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms","volume":"18 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2019-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/J.NIMB.2019.04.010","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}