Machine learning approach to transform scattering parameters to complex permittivities

Abstract

Abstract This study investigates the application of artificial neural networks to determine the complex dielectric material properties derived from experimental VNA scattering parameter measurements. The study utilizes a finite element approach to synthetically generate data to train the neural network. The neural network was trained using a supervised learning approach and validated using experimental measurement data. The frequency range of interest was between 0.1 and 13.5 GHz with the real part of the dielectric constants ranging from 1 − 100 and the imaginary part ranging from 0 − 0.2. This modelling approach decreases the uncertainty when compared to existing inverse approaches. This approach demonstrates a general framework that can be used for converting experimental or computational derived scattering parameters to complex permittivities.