{"title":"Plenary keynote address Tuesday: The business of test: Test and semiconductor economics","authors":"W. Rhines","doi":"10.1109/TEST.2016.7805816","DOIUrl":null,"url":null,"abstract":"Test methodology changes have historically been driven largely by necessity-critical needs for cost reduction or quality improvements. This history makes possible the prediction of future changes. Dr. Rhines will review the driving forces for prior discontinuities in design-for-test, analyze the rates of adoption of new test methodologies, and discuss the likely forces that will change our test priorities in the future.","PeriodicalId":6403,"journal":{"name":"2007 IEEE International Test Conference","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2016-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2016.7805816","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract
Test methodology changes have historically been driven largely by necessity-critical needs for cost reduction or quality improvements. This history makes possible the prediction of future changes. Dr. Rhines will review the driving forces for prior discontinuities in design-for-test, analyze the rates of adoption of new test methodologies, and discuss the likely forces that will change our test priorities in the future.
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