Sagarika Kumar, Hebatalla Alhamadani, Shaikha Hassan, Ahmad Alheloo, H. Hanifi, Jim Joseph John, G. Mathiak, V. Alberts
{"title":"Comparative Investigation and Analysis of Encapsulant Degradation and Glass Abrasion in Desert Exposed Photovoltaic Modules","authors":"Sagarika Kumar, Hebatalla Alhamadani, Shaikha Hassan, Ahmad Alheloo, H. Hanifi, Jim Joseph John, G. Mathiak, V. Alberts","doi":"10.1109/PVSC43889.2021.9519122","DOIUrl":null,"url":null,"abstract":"In 2015, a comparative study of different PV modules was started at the Outdoor Test Field (OTF) in the DEWA R&D Center at the MBR Solar Park, Dubai. Five monofacial module types (multi- and monocrystalline silicon) were investigated. Various non-destructive techniques such as current-voltage analysis, electroluminescence and ultraviolet fluorescence imaging, microscopic visual inspection and quantum efficiency analysis were used. The findings show the presence of signature patterns to identify encapsulant degradation in ultraviolet fluorescence images, with different shapes and severities. Microscopic visual inspection was also used to examine glass abrasion and yellowing. Quantum efficiency measurements at short wavelengths showed UV-blocker penetration.","PeriodicalId":6788,"journal":{"name":"2021 IEEE 48th Photovoltaic Specialists Conference (PVSC)","volume":"1971 1","pages":"0793-0798"},"PeriodicalIF":0.0000,"publicationDate":"2021-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE 48th Photovoltaic Specialists Conference (PVSC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC43889.2021.9519122","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
In 2015, a comparative study of different PV modules was started at the Outdoor Test Field (OTF) in the DEWA R&D Center at the MBR Solar Park, Dubai. Five monofacial module types (multi- and monocrystalline silicon) were investigated. Various non-destructive techniques such as current-voltage analysis, electroluminescence and ultraviolet fluorescence imaging, microscopic visual inspection and quantum efficiency analysis were used. The findings show the presence of signature patterns to identify encapsulant degradation in ultraviolet fluorescence images, with different shapes and severities. Microscopic visual inspection was also used to examine glass abrasion and yellowing. Quantum efficiency measurements at short wavelengths showed UV-blocker penetration.
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