Hole mobility in rubrene

W. Williams
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引用次数: 9

Abstract

The hole mobility in rubrene, in the c-direction, has been determined using time-of-flight measurements to be 2 cm2 V–1 s–1 at 473 K. The transport mechanism may be explained in terms of a band model with shallow trapping. No interpretable electron transport data were obtained.
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rubrene中的孔洞迁移率
在473 K下,利用飞行时间测量确定了rubrene在c方向上的空穴迁移率为2 cm2 V-1 s-1。输运机制可以用浅俘获带模型来解释。没有得到可解释的电子传递数据。
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