{"title":"BIST assisted wideband digital compensation for MB-UWB transmitters","authors":"S. Devarakond, Shreyas Sen, A. Chatterjee","doi":"10.1109/DDECS.2009.5012104","DOIUrl":null,"url":null,"abstract":"The recent demand in wireless standards capable of providing short-range, high-speed data transfer has accelerated the growth of the Ultra-Wide Band (UWB) standard. MB-OFDM (Multi Band Orthogonal Frequency Division Multiplexing) UWB devices suffer from frequency dependent non-idealities due to extreme wideband operation (3.1 to 10.6 GHz). Further these characteristics are subjected to process variations when implemented in nanometer technologies. In this paper we propose two BIST assisted methodologies for estimation and compensation of these effects. The proposed solutions differ in hardware vs. software tradeoffs. The improvement in the linearity of the mixer over a set of process instances and the tradeoffs involved are presented to validate the proposed methodology.","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":"83 1","pages":"84-89"},"PeriodicalIF":0.0000,"publicationDate":"2009-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DDECS.2009.5012104","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
The recent demand in wireless standards capable of providing short-range, high-speed data transfer has accelerated the growth of the Ultra-Wide Band (UWB) standard. MB-OFDM (Multi Band Orthogonal Frequency Division Multiplexing) UWB devices suffer from frequency dependent non-idealities due to extreme wideband operation (3.1 to 10.6 GHz). Further these characteristics are subjected to process variations when implemented in nanometer technologies. In this paper we propose two BIST assisted methodologies for estimation and compensation of these effects. The proposed solutions differ in hardware vs. software tradeoffs. The improvement in the linearity of the mixer over a set of process instances and the tradeoffs involved are presented to validate the proposed methodology.
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