The Structural and Optical Properties of Cobalt dioxide (CoO2 )Thin Films deposited via (SCSP) Technique for photovoltaic applications

M. Al-Helaly, Nathera A. Al-tememee
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Abstract

The research included the preparation and then studying the structural and optical properties of the cobalt dioxide (CoO2)films. The latter films were prepared using a semi-computerized spray pyrolysis technique (SCSPT),. The X-ray diffraction gave polycrystalline nature with crystal system trigonal (hexagonal axes), and the Energy Dispersive X-ray spectroscopy (EDX) showed that all films contain the elements (Co and O) indicating formation of (CoO2) films with high purity. FTIR measurements showed of chemical bonds of CoO2 clearly. Scanning Electron Microscopy (SEM ) Showed clearly that the formed thin films under the optimum conditions were homogeneous, dense and compact, and Atomic Force Microscopy(AFM) results showed that the topography of the film surface where surface roughness was found to be 7.91 nm, root mean square was 9.69 nm., and the average granularity diameter was 78.00 nm. The optical properties (absorbance, absorption coefficient, extinction coefficient, refractive index, optical Conductivity, the real ε_(1 ) and imaginary ε_2 part of the dielectric constant )were decreased with increasing the wavelength, while the transmittance increases with increasing wavelength. The optical energy gap was (1.98eV) and this is a good optical energy gap values for photovoltaic applications.
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利用(SCSP)技术沉积的光伏用二氧化钴薄膜的结构和光学性质
研究内容包括制备和研究二氧化钴薄膜的结构和光学性质。后一种薄膜采用半计算机化喷雾热解技术(SCSPT)制备。x射线衍射结果表明,薄膜为三(六)轴多晶系;x射线能谱分析(EDX)表明,所有薄膜均含有Co和O元素,表明形成了高纯度的(CoO2)薄膜。FTIR测量清楚地显示了CoO2的化学键。扫描电镜(SEM)结果表明,在最佳条件下制备的薄膜均匀、致密、致密;原子力显微镜(AFM)结果表明,薄膜表面形貌为7.91 nm,表面粗糙度为9.69 nm。,平均粒度直径为78.00 nm。光学性质(吸光度、吸收系数、消光系数、折射率、电导率、介电常数的实部ε_(1)和虚部ε_2)随波长的增加而降低,而透过率随波长的增加而增加。光能隙为(1.98eV),这是一个适合光伏应用的光能隙值。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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