P. Lendermann, S. Dauzére-Pérés, L. McGinnis, L. Mönch, Tina O'Donnell, Georg Seidel, P. Vialletelle
{"title":"Scheduling and Simulation in wafer fabs: Competitors, Independent Players or Amplifiers?","authors":"P. Lendermann, S. Dauzére-Pérés, L. McGinnis, L. Mönch, Tina O'Donnell, Georg Seidel, P. Vialletelle","doi":"10.1109/WSC48552.2020.9383872","DOIUrl":null,"url":null,"abstract":"This panel will discuss the inherent conflict between the application of (Discrete-Event) Simulation and Scheduling techniques to manage and optimise capacity and material flow in Semiconductor Frontend Manufacturing (wafer fabrication). Representatives from both industry and academia will describe advantages and shortcomings of the respective techniques, with a specific focus on challenges arising from the recent and anticipated future evolution of the nature of such manufacturing environments, and suggest solution approaches as well as research issues that need to be addressed.","PeriodicalId":6692,"journal":{"name":"2020 Winter Simulation Conference (WSC)","volume":"80 1","pages":"1861-1874"},"PeriodicalIF":0.0000,"publicationDate":"2020-12-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 Winter Simulation Conference (WSC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WSC48552.2020.9383872","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This panel will discuss the inherent conflict between the application of (Discrete-Event) Simulation and Scheduling techniques to manage and optimise capacity and material flow in Semiconductor Frontend Manufacturing (wafer fabrication). Representatives from both industry and academia will describe advantages and shortcomings of the respective techniques, with a specific focus on challenges arising from the recent and anticipated future evolution of the nature of such manufacturing environments, and suggest solution approaches as well as research issues that need to be addressed.