Investigation of thermally activated charging effects in RF-MEMS switches

IF 0.1 0 THEATER Teatro e Storia Pub Date : 2005-12-19 DOI:10.1109/SMICND.2005.1558740
M. Exarchos, V. Theonas, G. Papaioannou, G. Constantinidis, S. Psychias, D. Vasilache, M. Dragoman, A. Muller, D. Neculoiu
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Abstract

The paper presents the investigation of the temperature dependence of the charging mechanism in RF-MEMS switch insulating layer. The accumulated charge kinetics has been monitored through the transient response of the device capacitance. The transient response is shown to follow rather a stretched exponential law than an exponential one. The time scale of the process is found to be thermally activated, with an activation energy that is determined from Arrhenius plot. This allows the determination of the time constant of the contributing mechanism at room temperature.
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RF-MEMS开关热激活充电效应的研究
本文研究了RF-MEMS开关绝缘层充电机理的温度依赖性。通过器件电容的瞬态响应监测了累积电荷动力学。结果表明,瞬态响应遵循的是一种拉伸的指数律,而不是指数律。发现该过程的时间尺度是热激活的,活化能由Arrhenius图确定。这样就可以确定在室温下作用机理的时间常数。
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Teatro e Storia
Teatro e Storia THEATER-
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