Sequential testing of 3-level deep series-parallel systems

Abstract

Sequential testing problem requires the determination of the correct state of a system with the minimum expected cost. It has a wide range of applications. We consider the Sequential Testing problem of 3-level deep Series-Parallel systems. We show that it is possible to compute the expected cost of permutation strategies efficiently. We develop a hybrid simulated annealing-tabu search algorithm by utilizing this efficient method and we report the results of computational experiments for this algorithm and other algorithms proposed in the literature and their extensions.