Comparison of different test strategies on a mixed-signal circuit

J. Brenkus, V. Stopjaková, Ronny Vanhooren, A. Chichkov
{"title":"Comparison of different test strategies on a mixed-signal circuit","authors":"J. Brenkus, V. Stopjaková, Ronny Vanhooren, A. Chichkov","doi":"10.1109/DDECS.2009.5012090","DOIUrl":null,"url":null,"abstract":"An experiment comparing the efficiency of different test strategies on a moderate complexity mixed-signal circuit with 1300 nodes is presented. Selected test strategies from the groups of functional, structural and parametric approaches were considered. Bridging faults are taken into account and fault simulations results are shown, where fault coverage, efficiency and quality of the tests are evaluated.","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":"1 1","pages":"16-19"},"PeriodicalIF":0.0000,"publicationDate":"2009-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DDECS.2009.5012090","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

An experiment comparing the efficiency of different test strategies on a moderate complexity mixed-signal circuit with 1300 nodes is presented. Selected test strategies from the groups of functional, structural and parametric approaches were considered. Bridging faults are taken into account and fault simulations results are shown, where fault coverage, efficiency and quality of the tests are evaluated.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
混合信号电路中不同测试策略的比较
在1300个节点的中等复杂度混合信号电路上进行了测试,比较了不同测试策略的效率。从功能、结构和参数方法组中选择测试策略进行了考虑。考虑了桥接故障,给出了故障模拟结果,对故障覆盖率、测试效率和测试质量进行了评价。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Operational amplifiers D.C. circuits Test equipment and measurements The PIC microcontroller Circuit construction
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1