Enhanced ionization of organic salts in secondary-ion mass spectrometry

B.H. Hsu, Y.-X. Xie, K.L. Busch, R.G. Cooks
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引用次数: 26

Abstract

Ammonium chloride increases the absolute signal intensity for the intact cations of organic ammonium, pyrylium and phosphonium salts when admixed in 10−103-fold excess. This signal enhancement results in improved signal-to-noise ratios and is achieved without addition of extraneous ions to the spectrum. The ionization efficiency (secondary ions produced per incident primary ion) is similar for neat and ammonium chloride diluted samples. However, the ionization yield (secondary ions produced per sample molecule) is enhanced by the matrix by four orders of magnitude. Sensitivity, calculated here for a desorption ionization method, is 0.5−1 × 10−10 C μg−1, and is less than that of electron ionization and chemical ionization sources. Spectra of submicrogram amounts of organic species in ammonium chloride are stable and can be recorded continuously for many hours, as compared to less than an hour for the neat compounds. Even subnanogram amounts of sample diluted in ammonium chloride give spectra which last a number of minutes. Matrix-diluted samples may be withdrawn from the spectrometer and stored for days before being reanalyzed without incident. With this matrix, the technique is essentially nondestructive. Total ionization yields for matrix-diluted samples are estimated at 0.01-0.1%. Primary-ion fluxes impinging on matrix-diluted samples exceed static SIMS limits without evidence of beam damage.

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二级离子质谱法中有机盐的强化电离
当氯化铵添加量为10 ~ 103倍时,有机铵、吡啶和磷盐的完整阳离子的绝对信号强度增加。这种信号增强可提高信噪比,并且无需向频谱中添加外来离子即可实现。电离效率(每入射一次离子产生的二次离子)对于纯氯化铵和稀释后的样品是相似的。然而,电离产率(每个样品分子产生的二次离子)被基质提高了四个数量级。这里计算的解吸电离方法的灵敏度为0.5−1 × 10−10 C μg−1,小于电子电离和化学电离源的灵敏度。氯化铵中亚微克有机物质的光谱是稳定的,可以连续记录好几个小时,而整齐化合物的光谱记录不到一个小时。即使是亚纳克量的样品在氯化铵中稀释,其光谱也会持续几分钟。基质稀释后的样品可以从光谱仪中取出并储存数天,然后再进行分析,不会发生意外。有了这个矩阵,这项技术基本上是无损的。基质稀释样品的总电离产率估计为0.01-0.1%。碰撞在基质稀释样品上的初级离子通量超过静态SIMS极限而没有光束损伤的证据。
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Editorial Subject index Author index High resolution accurate mass measurements of FAB-generated ions by use of peak matching and multichannel analyzer techniques. Secondary ion mass spectrometry of low-temperature solids
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