Ab initio Calculations of the Thermoelectric Phonon Drag Effect in Semiconductor Nanostructures

Raja Sen, N. Vast, J. Sjakste
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Abstract

With the advance of materials fabrication techniques and increase of computational power during the past two decades, the research aiming to enhance the efficiency of thermoelectric devices, with the search of new materials and manipulation of materials properties at the nanoscale, has attracted significant interest. In general, the efficiency of thermoelectric materials, measured by the figure of merit ZT, directly depends on the Seebeck coefficient of the material. In the present work, we have studied, by combining the density functional theory calculations of the electron-phonon [1], [2] and phonon-phonon [3] interactions, the enhancement of the Seebeck coefficient due to electron-phonon coupling, known as the “phonon-drag” effect [4]. To account for this effect, we have solved the linearized Boltzmann equation for electronic transport in presence of non-equilibrium phonon populations introduced by a temperature gradient [5]. In order to understand the phonon drag effect at the nanoscale, we have studied the effect of direction-dependent nano-structuring effect on the Seebeck coefficient of silicon. We will present our recent results related to phonon and/or impurity limited carrier mobility, as well as the variation of the Seebeck coefficient of bulk and nanostructured silicon with temperature and carrier concentrations. Our results for $n$-doped silicon not only show a good agreement with the experimental data in both bulk samples [6] and nanostructures [7] but also pave the way to further understand the contribution of phonon-drag in other semiconductor nanostructures [8], which still remain largely unexplored.
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半导体纳米结构中热电声子拖拽效应的从头计算
近二十年来,随着材料制造技术的进步和计算能力的提高,以提高热电器件效率为目标的研究,以及对新材料的探索和对材料性质的纳米级操纵引起了人们的极大兴趣。一般来说,热电材料的效率,用性能值ZT来衡量,直接取决于材料的塞贝克系数。在本研究中,我们结合电子-声子[1]、[2]和声子-声子[3]相互作用的密度泛函理论计算,研究了电子-声子耦合导致的塞贝克系数的增强,即“声子-拖”效应[4]。为了解释这种影响,我们求解了由温度梯度引入的非平衡声子种群存在时电子输运的线性化玻尔兹曼方程[5]。为了在纳米尺度上理解声子拖拽效应,我们研究了方向相关的纳米结构效应对硅的塞贝克系数的影响。我们将介绍与声子和/或杂质限制载流子迁移率有关的最新结果,以及体积和纳米结构硅的塞贝克系数随温度和载流子浓度的变化。我们对$n$掺杂硅的研究结果不仅与体样品[6]和纳米结构[7]的实验数据吻合良好,而且为进一步了解声子-阻力在其他半导体纳米结构[8]中的作用铺平了道路,这些结构在很大程度上仍未被探索。
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