Reliability Analysis of Silicon Carbide Power Modules in Voltage Source Converters

Abstract

This paper performs reliability analysis to achieve an undesirable trade-off among the current ratings, efficiency, and reliability of power modules in Voltage Source Converters (VSC). It investigates the aspects of reliability for Silicon Carbide (SiC) power modules, and estimate the lifetime, failure rate and efficiency of the power electronic converters used in a three-phase grid connected photovoltaic system. The reliability analysis is carried out by performing Ideal Component Testing (ICT), and Active Component Testing (ACT) under four different operating modes. The probability rate of the system failure for each operating mode is calculated using Markov chain process. Finally, the dependency of reliability and lifetime on the gate voltage is identified and the necessary measures are suggested to achieve an undesirable trade-off among the targeted current ratings, efficiency, and system reliability.