{"title":"A new testing method of an enameled wire with a developed nanosecond pulse generator","authors":"M. Kando","doi":"10.1109/ICSD.1998.709330","DOIUrl":null,"url":null,"abstract":"This paper describes a newly developed nanosecond pulse generator in order to make tests for degradation in dielectrics, fault detection, breakdown voltage in gases, so on, and result of breakdown voltage on an enameled wire under a proposed testing method.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"28 1","pages":"485-488"},"PeriodicalIF":0.0000,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSD.1998.709330","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper describes a newly developed nanosecond pulse generator in order to make tests for degradation in dielectrics, fault detection, breakdown voltage in gases, so on, and result of breakdown voltage on an enameled wire under a proposed testing method.
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