Tan Zhang, Zihe Wang, F. Li, Xuejuan Hu, Wenjun Zhang, Xiaoxu Liu
{"title":"Automatic detection of surface defects based on deep random chains","authors":"Tan Zhang, Zihe Wang, F. Li, Xuejuan Hu, Wenjun Zhang, Xiaoxu Liu","doi":"10.2139/ssrn.4329704","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":12115,"journal":{"name":"Expert Syst. Appl.","volume":"21 1","pages":"120472"},"PeriodicalIF":0.0000,"publicationDate":"2023-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Expert Syst. Appl.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2139/ssrn.4329704","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}