High Resolution Core- and Valence-Level XPS Studies of the Properties (Structural, Chemical and Bonding) of Silicate Minerals and Glasses

1区 地球科学 Q1 Earth and Planetary Sciences Reviews in Mineralogy & Geochemistry Pub Date : 2014-01-01 DOI:10.2138/RMG.2014.78.7
H. Nesbitt, G. Bancroft
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引用次数: 39

Abstract

Core-level and valence-level X-ray Photoelectron Spectroscopy (XPS), developed in the late 1950’s and 1960’s by Siegbahn and coworkers (Siegbahn et al. 1969; Carlson 1975; Barr 1993; Fadley 2010) has become an invaluable tool over the last 40 years for studying mainly the surface properties and reactivity of a wide range of minerals, predominantly oxides (for reviews, see: Heinrich and Cox 1994; Chambers 2000; Salmeron and Schlogl 2008, and references in Bancroft et al. 2009; Newburg et al. 2011), sulfides (for reviews, see Hochella 1988; Bancroft and Hyland 1990; Nesbitt 2002; Murphy and Strongin 2009) and silicates (for a review see Hochella 1988; references in Biino and Groning 1998; Oelkers 2001; Zakaznova-Herzog et al. 2008). The large majority of these studies have focused on the first few surface monolayers of the minerals because of the surface sensitivity of the technique (~2–20 monolayers for photon energies of ≤ 1486 eV (Hochella 1988; Nesbitt 2002), and in many such cases, XPS has become the technique of choice for surface studies. Silicate XPS studies generally have focused on three surface applications outlined by Hochella (1988): (1) studies of the oxidation state of near surface atoms (e.g., Fe); (2) studies of sorption reactions on mineral surfaces; and (3) studies of the alteration and weathering of mineral surfaces. Fewer reports have focused on the fourth application of Hochella (1988), the study of the bulk atomic structure and chemical state properties of minerals and glasses. This is surprising perhaps, because the large majority (usually >90 %) of XPS line intensities comes from the bulk mineral in XPS studies using the typical laboratory Al K α X-ray sources (1486.6 eV). To emphasize this point, the surface S 2 p peaks from the …
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硅酸盐矿物和玻璃性质(结构、化学和键合)的高分辨率核价级XPS研究
核能级和价能级x射线光电子能谱(XPS),在20世纪50年代末和60年代由Siegbahn及其同事(Siegbahn et al. 1969;卡尔森1975;巴尔1993;Fadley 2010)已成为一个宝贵的工具,在过去的40年里,主要用于研究各种矿物的表面性质和反应性,主要是氧化物(评论见:Heinrich和Cox 1994;室2000;Salmeron and Schlogl 2008,以及Bancroft et al. 2009的参考文献;Newburg et al. 2011),硫化物(评论见Hochella 1988;Bancroft and Hyland 1990;奈斯比特2002;Murphy and Strongin 2009)和硅酸盐(回顾见Hochella 1988;Biino和Groning 1998中的参考文献;Oelkers 2001;Zakaznova-Herzog et al. 2008)。这些研究的大部分都集中在矿物的前几个表面单层上,因为该技术的表面灵敏度(~ 2-20个单层,光子能量≤1486 eV) (Hochella 1988;Nesbitt 2002),在许多这样的情况下,XPS已经成为表面研究的首选技术。硅酸盐XPS研究一般集中在Hochella(1988)概述的三种表面应用上:(1)近表面原子(如铁)的氧化态研究;(2)矿物表面吸附反应的研究;(3)矿物表面蚀变和风化的研究。较少的报道集中在Hochella(1988)的第四种应用,即对矿物和玻璃的体原子结构和化学状态性质的研究。这可能是令人惊讶的,因为在使用典型的实验室Al K α x射线源(1486.6 eV)进行的XPS研究中,XPS线强度的绝大多数(通常为bb0 - 90%)来自大块矿物。为了强调这一点,表面s2p从…
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来源期刊
Reviews in Mineralogy & Geochemistry
Reviews in Mineralogy & Geochemistry 地学-地球化学与地球物理
CiteScore
8.30
自引率
0.00%
发文量
39
期刊介绍: RiMG is a series of multi-authored, soft-bound volumes containing concise reviews of the literature and advances in theoretical and/or applied mineralogy, crystallography, petrology, and geochemistry. The content of each volume consists of fully developed text which can be used for self-study, research, or as a text-book for graduate-level courses. RiMG volumes are typically produced in conjunction with a short course but can also be published without a short course. The series is jointly published by the Mineralogical Society of America (MSA) and the Geochemical Society.
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