Fast numerical techniques for FE simulations in electrical capacitance tomography

IF 1 4区 工程技术 Q4 COMPUTER SCIENCE, INTERDISCIPLINARY APPLICATIONS Compel-The International Journal for Computation and Mathematics in Electrical and Electronic Engineering Pub Date : 2023-07-21 DOI:10.1108/compel-01-2023-0017
M. Neumayer, T. Suppan, T. Bretterklieber, H. Wegleiter, C. Fox
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Abstract

Purpose Nonlinear solution approaches for inverse problems require fast simulation techniques for the underlying sensing problem. In this work, the authors investigate finite element (FE) based sensor simulations for the inverse problem of electrical capacitance tomography. Two known computational bottlenecks are the assembly of the FE equation system as well as the computation of the Jacobian. Here, existing computation techniques like adjoint field approaches require additional simulations. This paper aims to present fast numerical techniques for the sensor simulation and computations with the Jacobian matrix. Design/methodology/approach For the FE equation system, a solution strategy based on Green’s functions is derived. Its relation to the solution of a standard FE formulation is discussed. A fast stiffness matrix assembly based on an eigenvector decomposition is shown. Based on the properties of the Green’s functions, Jacobian operations are derived, which allow the computation of matrix vector products with the Jacobian for free, i.e. no additional solves are required. This is demonstrated by a Broyden–Fletcher–Goldfarb–Shanno-based image reconstruction algorithm. Findings MATLAB-based time measurements of the new methods show a significant acceleration for all calculation steps compared to reference implementations with standard methods. E.g. for the Jacobian operations, improvement factors of well over 100 could be found. Originality/value The paper shows new methods for solving known computational tasks for solving inverse problems. A particular advantage is the coherent derivation and elaboration of the results. The approaches can also be applicable to other inverse problems.
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电容层析成像中有限元模拟的快速数值技术
目的:反问题的非线性求解方法需要对底层感知问题的快速仿真技术。在这项工作中,作者研究了基于有限元(FE)的传感器模拟的电容层析成像反问题。两个已知的计算瓶颈是有限元方程组的装配和雅可比矩阵的计算。在这里,现有的计算技术,如伴随场方法,需要额外的模拟。本文旨在介绍一种基于雅可比矩阵的传感器仿真与计算的快速数值技术。设计/方法/途径对于有限元方程系统,提出了一种基于格林函数的求解策略。讨论了它与标准有限元公式解的关系。给出了一种基于特征向量分解的快速刚度矩阵装配方法。基于格林函数的性质,导出了雅可比矩阵运算,使得矩阵向量与雅可比矩阵的乘积计算是免费的,即不需要额外的解。通过基于broyden - fletcher - goldfarb - shannon的图像重建算法证明了这一点。与使用标准方法的参考实现相比,基于matlab的新方法的时间测量显示所有计算步骤都有显着的加速。例如,对于雅可比矩阵运算,可以找到远远超过100的改进因子。原创性/价值本文展示了求解已知逆问题计算任务的新方法。一个特别的优点是连贯的推导和阐述的结果。该方法也适用于其他反问题。
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来源期刊
CiteScore
1.60
自引率
0.00%
发文量
124
审稿时长
4.2 months
期刊介绍: COMPEL exists for the discussion and dissemination of computational and analytical methods in electrical and electronic engineering. The main emphasis of papers should be on methods and new techniques, or the application of existing techniques in a novel way. Whilst papers with immediate application to particular engineering problems are welcome, so too are papers that form a basis for further development in the area of study. A double-blind review process ensures the content''s validity and relevance.
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