{"title":"Defect Classification in Electronic Components Using Dual-Channel Multi-Modal Convolutional Network","authors":"克林 程","doi":"10.12677/hjdm.2023.133027","DOIUrl":null,"url":null,"abstract":"In the field of defect detection for electronic components, the main methods are traditional image","PeriodicalId":57348,"journal":{"name":"数据挖掘","volume":"10 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"数据挖掘","FirstCategoryId":"1093","ListUrlMain":"https://doi.org/10.12677/hjdm.2023.133027","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In the field of defect detection for electronic components, the main methods are traditional image
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
