In-situ TEM Investigation of Solid Phase Transformations and Reactions

Abstract

In this paper, an example of phase analysis during annealing is presented using in-situ TEM. The example is demonstrated on amorphous Cu-Mn/C thin films focusing on phase identification in a multicomponent system. The transient states following the crystallization of the amorphous Cu-Mn alloy and the reaction with the C substrate were analyzed by evaluating the diffraction patterns recorded at different temperatures. The camera constant was calibrated using the internal standard method. The change in composition of the Cu(Mn) solid solution was calculated by separating the effect of thermal expansion and solute concentration. Identification of the forming phases was aided by analyzing and comparing the probability of formation of all phases in the Cu-Mn-C-O system. After the crystallization of amorphous Cu-Mn alloy into Cu(Mn) and α-Mn-based solid solutions, the formation of the following carbide phases was observed: Mn23C6, Mn5C2 and Mn7C3.