{"title":"V6: The Reflectometer at BER II","authors":"M. Trapp","doi":"10.17815/JLSRF-3-154","DOIUrl":null,"url":null,"abstract":"V6 is a fixed wavelength reflectometer dedicated to the investigation of thin films and surface structures at solid-air, solid-liquid and free liquid surfaces. The instrument is equipped with polarization analysis for studies of magnetic thin films, also in external magnetic fields and at low temperature.","PeriodicalId":16282,"journal":{"name":"Journal of large-scale research facilities JLSRF","volume":"12 1","pages":"114"},"PeriodicalIF":0.0000,"publicationDate":"2017-05-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of large-scale research facilities JLSRF","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.17815/JLSRF-3-154","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
V6 is a fixed wavelength reflectometer dedicated to the investigation of thin films and surface structures at solid-air, solid-liquid and free liquid surfaces. The instrument is equipped with polarization analysis for studies of magnetic thin films, also in external magnetic fields and at low temperature.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
