Understanding idle behavior and power gating mechanisms in the context of modern benchmarks on CPU-GPU Integrated systems

Manish Arora, Srilatha Manne, Indrani Paul, N. Jayasena, D. Tullsen
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引用次数: 32

Abstract

Overall energy consumption In modern computing systems Is significantly Impacted by Idle power. Power gating, also known as C6, Is an effective mechanism to reduce Idle power. However, C6 entry Incurs non-trivial overheads and can cause negative savings If the Idle duration Is short. As CPUs become tightly Integrated with GPUs and other accelerators, the Incidence of short duration Idle events are becoming Increasingly common. Even when Idle durations are long, It may still not be beneficial to power gate because of the overheads of cache flushing, especially with FinFET transistors. This paper presents a comprehensive analysis of idleness behavior of modern CPU workloads, consisting of both consumer and CPU-GPU benchmarks. It proposes techniques to accurately predict idle durations and develops power gating mechanisms that account for dynamic variations in the break-even point caused by varying cache dirtiness. Accounting for variations in the break-even point is even more important for FinFET transistors. In systems with FinFET transistors, the proposed mechanisms provide average energy reduction exceeding 8% and up to 36% over three currently employed schemes.
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在CPU-GPU集成系统的现代基准测试环境中理解空闲行为和功率门控机制
在现代计算系统中,总能耗受到闲置功率的显著影响。功率门控,也称为C6,是一种有效的机制,以减少闲置功率。但是,如果空闲持续时间很短,C6条目会产生不小的开销,并可能导致负节省。随着cpu与gpu和其他加速器的紧密集成,短时间空闲事件的发生率变得越来越普遍。即使空闲持续时间很长,由于缓存刷新的开销,特别是对于FinFET晶体管,它仍然可能对电源栅极不利。本文对现代CPU工作负载的空闲行为进行了全面分析,包括消费者和CPU- gpu基准测试。它提出了准确预测空闲持续时间的技术,并开发了功率门控机制,该机制可以解释由不同缓存污染引起的盈亏平衡点的动态变化。对于FinFET晶体管来说,考虑盈亏平衡点的变化更为重要。在具有FinFET晶体管的系统中,与目前采用的三种方案相比,所提出的机制提供的平均能量降低超过8%,高达36%。
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