Time-resolved measurements in spark source mass spectrometry. I. Deflection of the ion beam

M. Viczián, I. Cornides, J. Van Puymbroeck, R. Gijbels
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引用次数: 10

Abstract

The synchronous passer system of a JEOL spark source mass spectrometer was modified so that the ion beam could be deflected at a variable time after the start of the first of a series of discharges. The transmitted part of the ion beam was analyzed by photoplate detection.

Time-resolved measurements revealed a different behaviour between different ionic species of the same m/z value. The singly-charged atomic ions were delayed by (150±100) ns with respect to the multiply-charged ions. Molecular ions were found to be delayed by about 700 ns (Cn+) or even one or more μs (Sn+, SCn+) relative to multiply-charged ions.

The duration of the production/extraction process of multiply- and singly-charged ions was well defined in time, while this process could last for several μs in the case of polyatomic ions.

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火花源质谱法的时间分辨测量。1、离子束偏转
对JEOL火花源质谱仪的同步传递系统进行了改进,使离子束在一系列放电的第一次开始后可以在可变时间内偏转。利用光板检测对离子束的透射部分进行了分析。时间分辨测量揭示了相同m/z值的不同离子种类之间的不同行为。单电荷原子离子相对于多电荷离子延迟(150±100)ns。发现分子离子相对于多电荷离子延迟约700ns (Cn+),甚至一个或多个μs (Sn+, SCn+)。多原子离子和单原子离子的产生/提取过程在时间上有很好的定义,而多原子离子的产生/提取过程可以持续几μs。
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Editorial Subject index Author index High resolution accurate mass measurements of FAB-generated ions by use of peak matching and multichannel analyzer techniques. Secondary ion mass spectrometry of low-temperature solids
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