{"title":"Semiconductor Sensors for XRD Imaging","authors":"K. Iniewski, A. Grosser","doi":"10.1201/9780429196492-2","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":23769,"journal":{"name":"X-Ray Diffraction Imaging","volume":"9 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2018-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"X-Ray Diffraction Imaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1201/9780429196492-2","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
