Y. Kajihara, T. Yokoyama, Kuan-ting Lin, Sunmi Kim
{"title":"Probing thermal evanescent waves on dielectric surfaces","authors":"Y. Kajihara, T. Yokoyama, Kuan-ting Lin, Sunmi Kim","doi":"10.1109/IRMMW-THZ.2015.7327680","DOIUrl":null,"url":null,"abstract":"Our passive near-field microscope probes thermal evanescent waves due to local phenomena on material's surface. With the microscope, we study dielectric samples since they have surface phonon resonances whose resonance wavelengths are very close to our detection wavelength. From the results, GaAs, SiC, and AlN show reasonable signals due to thermal fluctuations, whereas GaN show very unique characteristics. In this report, we show and discuss the results.","PeriodicalId":6577,"journal":{"name":"2015 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz)","volume":"56 1","pages":"1-2"},"PeriodicalIF":0.0000,"publicationDate":"2015-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRMMW-THZ.2015.7327680","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Our passive near-field microscope probes thermal evanescent waves due to local phenomena on material's surface. With the microscope, we study dielectric samples since they have surface phonon resonances whose resonance wavelengths are very close to our detection wavelength. From the results, GaAs, SiC, and AlN show reasonable signals due to thermal fluctuations, whereas GaN show very unique characteristics. In this report, we show and discuss the results.
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