Matei-Ion Oprea, S. Spataru, D. Sera, P. Poulsen, Sune Thorsteinsson, R. Basu, A. R. Andersen, Kenn H. B. Frederiksen
{"title":"Detection of potential induced degradation in c-Si PV panels using electrical impedance spectroscopy","authors":"Matei-Ion Oprea, S. Spataru, D. Sera, P. Poulsen, Sune Thorsteinsson, R. Basu, A. R. Andersen, Kenn H. B. Frederiksen","doi":"10.1109/PVSC.2016.7749885","DOIUrl":null,"url":null,"abstract":"Impedance spectroscopy (IS) is an established characterization and diagnostic method for different electrical and chemical research areas such as batteries and fuel cells, but not yet widely adopted for photovoltaics (PV). This work, for the first time, investigates an IS based method for detecting potential-induced degradation (PID) in c-Si PV panels. The method has been experimentally tested on a set of panels that were confirmed to be affected by PID by using traditional current-voltage (I-V) characterization methods, as well as electroluminescence (EL) imaging. The results confirm the effectiveness of the new approach to identify PID in PV panels.","PeriodicalId":6524,"journal":{"name":"2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2016-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC.2016.7749885","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16
Abstract
Impedance spectroscopy (IS) is an established characterization and diagnostic method for different electrical and chemical research areas such as batteries and fuel cells, but not yet widely adopted for photovoltaics (PV). This work, for the first time, investigates an IS based method for detecting potential-induced degradation (PID) in c-Si PV panels. The method has been experimentally tested on a set of panels that were confirmed to be affected by PID by using traditional current-voltage (I-V) characterization methods, as well as electroluminescence (EL) imaging. The results confirm the effectiveness of the new approach to identify PID in PV panels.
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