{"title":"Gate-level test generation for sequential circuits","authors":"K. Cheng","doi":"10.1145/238997.238999","DOIUrl":null,"url":null,"abstract":"This paper discusses the gate-level automatic test pattern generation (ATPG) methods and techniques for sequential circuits. The basic concepts, examples, advantages, and limitations of representative methods are reviewed in detail. The relationship between gate-level sequential circuit ATPG and the partial scan design is also discussed.","PeriodicalId":7063,"journal":{"name":"ACM Trans. Design Autom. Electr. Syst.","volume":"25 1","pages":"405-442"},"PeriodicalIF":0.0000,"publicationDate":"1996-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"24","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACM Trans. Design Autom. Electr. Syst.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/238997.238999","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 24
Abstract
This paper discusses the gate-level automatic test pattern generation (ATPG) methods and techniques for sequential circuits. The basic concepts, examples, advantages, and limitations of representative methods are reviewed in detail. The relationship between gate-level sequential circuit ATPG and the partial scan design is also discussed.
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